BJT/MOS high-frequency small-signal models, amplifier poles, Miller effect and bandwidth analysis.
Frequency response, Miller effect, cascode & noise
AE-04 begins where the midband transistor model stops being sufficient. Internal charge storage first creates frequency-dependent device models; those elements then generate amplifier poles and zeros, Miller multiplication, cascode bandwidth changes and finally noise/bandwidth trade-offs. Each chapter keeps the device model tied to the actual biased circuit rather than treating frequency response as a detached transfer-function exercise.
- AE-01 — transistor small-signal models
- AE-02 — single-stage amplifiers & active loads
- AC-02 — transfer functions & Bode
- DY-02 — poles, damping & resonance
- Build BJT/MOS high-frequency models from charge storage.
- Derive amplifier poles and zeros from the small-signal circuit.
- Derive the Miller effect instead of applying it as a memorized rule.
- Explain how cascode topology changes gain, coupling and bandwidth.
- Calculate and interpret thermal, shot/flicker noise and noise–bandwidth trade-offs.
Five readings from charge storage to noise–bandwidth trade-offs.
AE-04 begins where the midband transistor model stops being sufficient. Internal charge storage first creates frequency-dependent device models; those elements then generate amplifier poles and zeros, Miller multiplication, cascode bandwidth changes and finally noise/bandwidth trade-offs. Each chapter keeps the device model tied to the actual biased circuit rather than treating frequency response as a detached transfer-function exercise.
- 01→
Transistor high-frequency models
Extend the low-frequency BJT and MOS small-signal models by adding the charge-storage paths that become electrically active as frequency rises. Derive how Cπ/Cμ or Cgs/Cgd/Cdb create frequency-dependent input and output currents, distinguish current-gain pole fβ from transition frequency fT, and keep intrinsic device speed separate from the bandwidth of a complete amplifier that also contains source, load and feedback impedances.
220–280 min · Advanced · available - 02→
Poles and zeros in amplifiers
Move from device capacitances to the frequency response of a complete biased stage. Derive poles from the natural-response denominator rather than assigning one pole per capacitor, derive zeros from feed-forward terms in the transfer numerator, solve a separated two-node amplifier exactly, introduce open-circuit time constants as an approximation tool, and show how Cgd/Cμ can create a right-half-plane zero even before the Miller approximation is invoked.
230–290 min · Advanced · available - 03→
Miller effect
Derive the Miller transformation from the current through a two-node impedance rather than memorizing a multiplied-capacitance rule. Show that an impedance Z between nodes v1 and v2=Av·v1 can be replaced, for that transfer relation, by Zin=Z/(1−Av) and Zout=Z/(1−1/Av). Specialize to Cgd/Cμ, explain why inverting gain creates a large apparent input capacitance, why a follower can bootstrap the same capacitor, and where the approximation fails when Av is frequency dependent.
220–280 min · Advanced · available - 04→
Cascode principle
Use a common-gate/common-base transistor above a common-source/common-emitter input device to separate high gain from large input-device drain/collector swing. Derive the low impedance of the internal node, the resulting suppression of Cgd/Cμ Miller multiplication, the large output resistance of the stacked pair, and the resulting pole redistribution. Treat the cascode as a trade among gain, reverse isolation, headroom, internal-node dynamics and output loading rather than as a universal bandwidth multiplier.
230–290 min · Advanced · available - 05→
Noise sources & bandwidth trade-offs
Treat electronic noise as a spectral quantity before integrating it into an RMS voltage or current. Fix a one-sided PSD convention, derive resistor thermal noise, shot noise and transistor channel noise models, introduce flicker noise and input-referred noise, propagate independent sources through their own transfer functions, define equivalent noise bandwidth, derive kT/C for an RC network, and connect bandwidth, gm, resistance, device area and capacitance to quantitative noise trade-offs.
240–300 min · Advanced · available
References used
High-frequency transistor models and amplifier response are anchored in Sedra/Smith, Razavi and Gray et al.; the final noise chapter adds van der Ziel for the physical/statistical noise foundation.
Physical interpretation of device capacitances, open-circuit time constants, Miller effect, cascode bandwidth and electronic noise.
MOS high-frequency models, cascode stages, frequency response and integrated-circuit noise reasoning.
High-frequency transistor models, pole/zero analysis, cascodes, compensation and noise in analog IC stages.
Physical and statistical foundations for thermal, shot and flicker noise used in the final chapter.