S-parameter experiments
Calibration plane, sweep settings, raw .s1p/.s2p data, DUT photos and simulation comparison.
Real Measurement Library
Measurement is part of the engineering argument.
AoN will preserve the path from theoretical expectation to raw instrument data, calibration, interpretation and independent reproduction.
Evidence ladder
A number alone is not a verified measurement.
The platform records how much evidence accompanies a result instead of hiding uncertainty behind one generic “verified” badge.
01 · Self reported
A result is stated, but raw evidence is not attached yet.
02 · Data attached
Raw Touchstone, CSV, scope export or equivalent evidence is available.
03 · Reproducible
Instrument, setup, calibration, conditions and method are documented.
04 · Peer reviewed
A technically qualified member has reviewed the method and interpretation.
05 · Verified
The evidence satisfies the Art of Nanoelectronics verification criteria.
Time-domain evidence
Waveforms, probe/loading conditions, FFT, measured gain, distortion and uncertainty notes.
Transport measurements
Later tracks can include Hall, van der Pauw, TLM and other evidence-backed characterization workflows.
“I reproduced this” will matter more than a like.
Projects and measurements will eventually display independent reproductions and link each reproduction to its own dataset, setup and interpretation.