Lumped matching, transmission lines and S parameters.
Matching networks and passive microwave design
Derive realizable impedance transformations at microwave frequencies, synthesize matching circuits from signed reactance and susceptance, and validate losses, bandwidth and measurement reference planes.
- RF-01
- RF-04
- RF-05
- Define input matching for a real-positive reference resistance and distinguish source conjugate matching.
- Deduce the correct topology when the load resistance exceeds the source resistance.
- Deduce the reversed topology when the source resistance exceeds the load resistance.
- Derive B and X from nodal admittance and complex impedance, without memorizing recipes.
- Translate the two signed solutions into physically positive L and C values.
- Compute an ideal 50-to-200 Ω transformation at 1 GHz and check its input impedance.
- Compute the reversed 200-to-50 Ω case from its own admittance equation.
- Distinguish the ideal center-frequency match from bandwidth and dissipation.
- Explain VNA S11 calibration and why measuring insertion loss also requires a two-port fixture.
- Document component tolerances, substrate/fixture parasitics and experimental uncertainty.
Matching networks and passive microwave design
All five chapters are published with derivations and worked exercises.
- 01→
L-section impedance matching: topology, exact derivation and VNA check
Choose the physically realizable shunt/series order, derive both sign branches, build 50-to-200 Ω and 200-to-50 Ω circuits at 1 GHz, and audit loss and bandwidth.
190–250 min · Intermediate to advanced - 02→
Pi and T matching networks
Derive and build low-pass Pi/T transformations from virtual-resistance constraints, exact node equations and measured reference planes.
220–300 min · Advanced - 03→
Single- and double-stub impedance matching
Guided-line admittance, open/short stubs, single- and double-tee transformations, Smith charts and forbidden regions.
240–320 min · Advanced - 04→
Distributed resonators and microwave filters
Standing-wave boundaries, quarter/half-wave modes, unloaded and loaded Q, coupling extraction and a two-pole Butterworth design.
250–330 min · Advanced - 05→
Microwave losses, bandwidth and practical constraints
Conductor/dielectric loss, skin effect, distributed attenuation, manufacturing tolerances, SOLT/TRL calibration and de-embedding.
260–340 min · Advanced
References
Derivations assume positive real resistances and ideal reactive elements unless indicated otherwise.
Network analysis and microwave power relations.